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百及納米ParcanNano快捷型原子力顯微鏡AFM

簡(jiǎn)介：
公司以全球獨(dú) 家專利的針尖技術(shù)為核心競(jìng)爭(zhēng)力，技術(shù)源自于德國(guó)伊爾默瑙工業(yè)大學(xué)，致力于主動(dòng)式針尖技術(shù)在微納米結(jié)構(gòu)制備和表征方面的研發(fā)，及其相關(guān)設(shè)備的產(chǎn)業(yè)化。

NanoMETRONOM是公司開(kāi)發(fā)的一款顛覆性的新型AFM系統(tǒng)。它使用主動(dòng)式智能針尖，集傳感器、驅(qū)動(dòng)器和可功能化的針尖于一身，實(shí)現(xiàn)自激發(fā)和自傳感，無(wú)需復(fù)雜的激光校準(zhǔn)，是取代現(xiàn)有AFM激光傳感的巨大改進(jìn)。該系統(tǒng)可在大氣、液態(tài)及真空環(huán)境下實(shí)現(xiàn)對(duì)微納米結(jié)構(gòu)的高速、高效表征，成像精度達(dá)到0.2納米的極限精度。

產(chǎn)品擁有像美國(guó)麻省理工學(xué)院、加州伯克利國(guó)家實(shí)驗(yàn)室、荷蘭德?tīng)柗蛱卮髮W(xué)和清華大學(xué)等國(guó)內(nèi)外知名科研客戶，以及韓國(guó)三星、荷蘭ASML等高端工業(yè)客戶。

產(chǎn)品特點(diǎn)：
。 大氣、真空及液態(tài)環(huán)境兼容
。 自激發(fā)自傳感智能針尖
。 快速自動(dòng)進(jìn)針 無(wú)需激光調(diào)節(jié)
。 操作極其便捷 5秒快速換針
。 超高速掃描成像（100 lines/s）
。 實(shí)時(shí)光學(xué)顯微鏡定位掃描區(qū)域

應(yīng)用領(lǐng)域：
。 多領(lǐng)域表面分析
。 工業(yè)領(lǐng)域快速抽檢
。晶圓片表面質(zhì)量監(jiān)控
。 弱機(jī)械力檢測(cè)
。 質(zhì)量傳感器
。 生化檢測(cè)識(shí)別

AFM 100 nano ParcanNano fast atomic force microscope

Brief introduction:

The company takes the global exclusive patent tip technology as the core competitiveness, the technology is derived from the technical University of Ilmernau, Germany, is committed to the active tip technology in the preparation and characterization of micro and nano structure research and development, and the industrialization of related equipment.

NanoMETRONOM is a disruptive new AFM system developed by the company. It uses an active intelligent tip that combines sensors, actuators, and functionalized tips to achieve self-excitation and self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can achieve high speed and high efficiency characterization of micro and nano structures in atmospheric, liquid and vacuum environments, and the imaging accuracy reaches the limit accuracy of 0.2 nm.

Our products have well-known research customers at home and abroad such as Massachusetts Institute of Technology, Berkeley National Laboratory in California, Delft University and Tsinghua University in the Netherlands, as well as high-end industrial customers such as Samsung in South Korea and ASML in the Netherlands.

Product Features:

. Compatible with atmosphere, vacuum and liquid environment

. Self-excitation and self-sensing intelligent tip

. Fast automatic needle feeding without laser adjustment

. Extremely convenient operation 5 seconds fast needle change

. Ultra-high speed scanning imaging (100 lines/s)

. The scanning area was located by real-time light microscopy

Field of Application:

. Multidomain surface analysis

. Rapid spot inspection in the industrial field

. Wafer surface quality control

. Weak mechanical force detection

. Mass sensor sensor

. Identification by biochemical detection

Product advantage

The AFM 100-stage nanoParcannano high-speed atomic force microscope (AFM) uses an active intelligent needle tip that integrates a sensor, driver, and functional needle tip to achieve self-excitation and self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can realize high-speed and GX characterization of micro and nano structures in atmospheric, liquid and vacuum environments, and the imaging accuracy reaches the limit accuracy of 0.2 nm.